ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,429, issued on June 23, was assigned to C A Casyso GmbH (Basel, Switzerland). "Cartridge device for a measuring system for measuring viscoe... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,430, issued on June 23, was assigned to MGI Tech Co. Ltd. (Shenzhen, China). "Automated library preparation system" was invented by Jiandon... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,431, issued on June 23, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Sample conveying device and method with speed abnormality detecti... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,432, issued on June 23, was assigned to LAW-NDT Mess- und Prufsysteme GmbH (Schiesheim, Germany). "Test system for a plurality of separable... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,433, issued on June 23, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Automatic sample injection device and method of controlling automat... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,434, issued on June 23, was assigned to SAUDI ARABIAN OIL COMPANY (Dhahran, Saudi Arabia). "Automated tank sampler system" was invented by ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,435, issued on June 23, was assigned to Brown University (Providence, R.I.). "System and method for scanning near-field optical microscopy"... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,436, issued on June 23, was assigned to LEENO INDUSTRIAL INC. (Busan, South Korea). "Test socket and method for fabricating the same" was i... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,437, issued on June 23, was assigned to ISC Co. LTD (Seongnam-si, South Korea). "Test socket" was invented by Jong Woo Oh (Seongnam-si, Sou... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,438, issued on June 23, was assigned to okins electronics Co. Ltd (Uiwang-si, South Korea). "Test socket and assembly device thereof" was i... और पढ़ें